An Italian research centre, involved in R&D activities on photovoltaic technology, has developed a new Universal reflectometer for non-destructive optical characterisation of materials and devices for solar energy. The new Universal reflectometer is realised with a 40-cm-diameter integrating sphere, suitable for any type of optical measurements on small (units of square cm) and large (units of square meters) planar samples.
The class of measurements are:
- R (Reflectance), T (Transmittance), A (Absorbance) on small and large samples at direct light at changing wavelength and angle of incidence.
- R, T, A on small and large samples at diffuse, isotropic light at changing wavelength.
- R on small samples at direct light at changing wavelength and angle of incidence from 0° to ˜90°, with laser or lamp sources.
Details of possible measurements:
- Direct light:
* Total reflectance at changing wavelength and angle of incidence in a continuous way
* Diffuse reflectance at changing wavelength and angle of incidence in a continuous way
* Total transmittance at changing wavelength and angle of incidence in a continuous way
* Diffuse transmittance at changing wavelength and angle of incidence in a continuous way
- Diffuse light:
* Total reflectance at changing wavelength
* Total transmittance at changing wavelength
Innovative Aspects:
- Non-destructive characterisation of large samples (PV modules, semitransparent sheets, windows, etc)
- A single, universal instrument is able to carry out any optical measurement on both small and large samples
- Angle-resolved reflectance measurements on small samples with no limits on the incidence angle, by using large, collimated beams from any type of light source
Main Advantages:
- Non-destructive technique
- It allows any type of optical measurements (R, T, A) under collimated or diffused illumination
- It is suited for small and large samples